[1]汪喆,赵艺,郝巧燕,等.利用光学对比鉴定石墨烯和硒化铟的层数[J].深圳大学学报理工版,2019,36(4):382-386.[doi:10.3724/SP.J.1249.2019.04382]
　WANG Zhe,ZHAO Yi,HAO Qiaoyan,et al.Layer number identification of graphene and InSe by optical contrast[J].Journal of Shenzhen University Science and Engineering,2019,36(4):382-386.[doi:10.3724/SP.J.1249.2019.04382]
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利用光学对比鉴定石墨烯和硒化铟的层数()
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《深圳大学学报理工版》[ISSN:1000-2618/CN:44-1401/N]

卷:
第36卷
期数:
2019年第4期
页码:
382-386
栏目:
【材料科学】
出版日期:
2019-07-10

文章信息/Info

Title:
Layer number identification of graphene and InSe by optical contrast
作者:
汪喆; 赵艺; 郝巧燕; 刘季冬; 柯宇轩; 张文静
深圳大学光电工程学院，广东深圳518060
Author(s):
WANG Zhe;  ZHAO Yi;  HAO Qiaoyan;  LIU Jidong;  KE Yuxuan;  and ZHANG Wenjing
College of Optoelectronic Engineering, Shenzhen University, Shenzhen 518060, Guangdong Province, P.R.China
关键词:
物理电子学; 石墨烯; 硒化铟; 层数鉴定; 光学对比;  拉曼; 原子力显微镜
Keywords:
physical electronics;  graphene;  InSe;  layer number identification;  optical contrast;  Raman spectroscopy;  atomic force microscopy (AFM)
分类号:
O433; TN29
DOI:
10.3724/SP.J.1249.2019.04382
文献标志码:
A
摘要:
石墨烯和硒化铟是两种性能极佳的二维材料，其性能会随着层数的变化而发生改变. 光学对比法可用于快速鉴定石墨烯和硒化铟的层数.通过多光束平行平板干涉模型，计算出1层至4层的样品在单抛氧化硅片上的理论反射率对比值；采用机械剥离的方法，制备1层至4层的样品，利用共聚焦拉曼光谱仪和原子力显微镜对其层数加以明确；利用ImageJ软件求取样品与衬底的R（G）值，进而计算出实际反射率对比值.实验结果表明，1层至4层样品实际反射率对比值与理论反射率对比值的误差均小于6%.本研究方法具有一定的准确性和速效性，为快速鉴定石墨烯和硒化铟的层数提供了理论基础和实验支持.
Abstract:
Graphene and indium selenide (InSe) have attracted extensive attention in virtue of their extraordinary properties as typical two-dimensional (2D) materials. Their properties depend on the number of layers. Optical contrast method is useful for identifying the layer number of graphene and InSe rapidly. Firstly, a model of Multiple-Beam Interference in a Parallel Plate is applied to calculate the theoretical reflectivity of samples from monolayer to four layers on SiO2/Si substrate. Then, we prepare samples with monolayer to four layers by using mechanical exfoliation method, and characterize the layer number using Raman and atomic force microscopy (AFM).Their actual reflectivity contrast is calculated by collecting the R（G） value of both samples and the substrate using the software of ImageJ. The result shows that the deviation between the actual and theoretical reflectivity contrast from monolayer to four-layer graphene and InSe matched well with derivation of less than 6%. These results indicate that the optical contrast method has certain accuracy and efficiency and provides theoretical basis and experimental support for rapid identification of layers of graphene and InSe.

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更新日期/Last Update: 2019-07-04