相似文献/References:
[1]覃金牛,温喜章,冯武昌,等.退火温度对ZnO薄膜晶体管电学性能的影响[J].深圳大学学报理工版,2019,36(4):375.[doi:10.3724/SP.J.1249.2019.04375]
QIN Jinniu,WEN Xizhang,FENG Wuchang,et al.Effect of annealing temperature on the electrical properties of ZnO thin-film transistors[J].Journal of Shenzhen University Science and Engineering,2019,36(4):375.[doi:10.3724/SP.J.1249.2019.04375]