[1]王晖.一种改进的模拟电路k故障诊断算法[J].深圳大学学报理工版,1997,14(4):14-18.
 Wang Hui.An Improved Method of k Fault Diagnosis in Analog Circuit[J].Journal of Shenzhen University Science and Engineering,1997,14(4):14-18.
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一种改进的模拟电路k故障诊断算法()
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《深圳大学学报理工版》[ISSN:1000-2618/CN:44-1401/N]

卷:
第14卷
期数:
1997年4期
页码:
14-18
栏目:
电子与信息科学
出版日期:
1997-12-30

文章信息/Info

Title:
An Improved Method of k Fault Diagnosis in Analog Circuit
作者:
王晖
深圳大学电子工程系,深圳 518060
Author(s):
Wang Hui
Department of Electronic Engineering Shenzhen University, Shenzhen 518060, P. R. China
分类号:
TM 131
摘要:
利用元件容差的两石退本特性,给出了呀中从总体上估计容差的改进k故障诊断算法,实验结果表明本文算法可以准确地定位故障,且受容差的影响较小.
Abstract:
In terms of two characteristics of element tolerance, an improved method of k fault diagnosis is proposed, it estimates the effect of tolerance to diagnosis in totle. Two examples are presented to demonstrate the effective of the algorithm.
更新日期/Last Update: 2016-03-15