[1]王晖.一种改进的模拟电路k故障诊断算法[J].深圳大学学报理工版,1997,14(4):14-18.
Wang Hui.An Improved Method of k Fault Diagnosis in Analog Circuit[J].Journal of Shenzhen University Science and Engineering,1997,14(4):14-18.
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一种改进的模拟电路k故障诊断算法(
)
《深圳大学学报理工版》[ISSN:1000-2618/CN:44-1401/N]
- 卷:
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第14卷
- 期数:
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1997年4期
- 页码:
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14-18
- 栏目:
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电子与信息科学
- 出版日期:
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1997-12-30
文章信息/Info
- Title:
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An Improved Method of k Fault Diagnosis in Analog Circuit
- 作者:
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王晖
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深圳大学电子工程系，深圳 518060
- Author(s):
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Wang Hui
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Department of Electronic Engineering Shenzhen University, Shenzhen 518060, P. R. China
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- 分类号:
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TM 131
- 摘要:
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利用元件容差的两石退本特性，给出了呀中从总体上估计容差的改进k故障诊断算法，实验结果表明本文算法可以准确地定位故障，且受容差的影响较小.
- Abstract:
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In terms of two characteristics of element tolerance, an improved method of k fault diagnosis is proposed, it estimates the effect of tolerance to diagnosis in totle. Two examples are presented to demonstrate the effective of the algorithm.
更新日期/Last Update:
2016-03-15