[1]王建萍.单片微机控制的数字集成电路测试仪[J].深圳大学学报理工版,1988,(3-4):55-61.
 Wang Jianping.Digital Integrated Circuit Tester Controlled By Single Chip Microcomputer[J].Journal of Shenzhen University Science and Engineering,1988,(3-4):55-61.
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单片微机控制的数字集成电路测试仪()
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《深圳大学学报理工版》[ISSN:1000-2618/CN:44-1401/N]

卷:
期数:
1988年3-4期
页码:
55-61
栏目:
环境与能源
出版日期:
1988-12-31

文章信息/Info

Title:
Digital Integrated Circuit Tester Controlled By Single Chip Microcomputer
作者:
王建萍
深圳大学机电与控制工程学院
Author(s):
Wang Jianping
Department of mechanical and electrical engineering, Shenzhen University
文献标志码:
A
摘要:
本文介绍一种新型的单片微机控制的数字集成电路测试仪。这种测试仪相比同类型的产品,增设了故障定位、自动搜寻型号、阈值电平检测,TTL和CMOS皆测、输出程控波形等功能,它适用于集成电路研究、制造、使用等单位,是一种较理想的功能测试仪。
Abstract:
This paper introduces a new type digital integrated circuit tester controlled by single chip computer. The tester increases many functions, e.g. fault location, type searching, threshold potential detection,test for both TTL and CMOS circuits, rout put program-controlled waveforms as compared with other testers. It is a useful functional fester suitable for the organizations of developing, manufacturing and using the IC chips.
更新日期/Last Update: 2016-05-18